000			01554cam a22003374a 4500
001			12158086
003			OSt
005			20150408114150.0
008			000829s2000 maua b 001 0 eng
010			_a 00046212
020			_a0792379918 (alk. paper)
040			_aDLC _cDLC _dDLC
042			_apcc
050	0	0	_aTK7874.75 _b.B87 2000
082	0	0	_a621.39/5 _221 _bBME
100	1		_aBushnell, Michael L. _q(Michael Lee), _d1950- _939527
245	1	0	_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / _cMichael L. Bushnell, Vishwani D. Agrawal.
260			_aBoston : _bKluwer Academic, _cc2000.
300			_axviii, 690 p. : _bill. ; _c26 cm.
440		0	_aFrontiers in electronic testing ; _v17 _939528
504			_aIncludes bibliographical references (p. [631]-670) and index.
650		0	_aIntegrated circuits _xVery large scale integration _xTesting. _939529
650		0	_aDigital integrated circuits _xTesting. _939463
650		0	_aMixed signal circuits _xTesting. _939530
650		0	_aSemiconductor storage devices _xTesting. _939531
700	1		_aAgrawal, Vishwani D., _d1943- _939532
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0821/00046212-t.html
906			_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg
942			_2ddc _cDVD
999			_c31961 _d266461