01515cam a2200373 a 4500 13936063 OSt 20150408114222.0 050420s2006 njua b 001 0 eng 2005048514 GBA573304 bnb 013282982 Uk 0471739065 (acidfree paper) 9780471739067 (OCoLC)ocm59360243 DLC DLC BAKER UKM C#P DLC QC611 .S335 2006 621.3815/2 22 SDS Schroder, Dieter K. 46038 Semiconductor material and device characterization / Dieter K. Schroder. 3rd ed. [Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, c2006. xv, 779 p. : ill. ; 25 cm. "Wiley-Interscience." Includes bibliographical references and index. Semiconductors. Semiconductors Testing. 46039 Publisher description http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html Table of contents only http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html Contributor biographical information http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html 7 cbc orignew 1 ocip 20 y-gencatlg ddc BOOK 35465 269965 0 2014-07-08 0 0 621.3815/2 SDS 2014-07-08 CL 00652193 CL 2014-07-08 00:00:00 BOOK ddc 0 0 2014-07-08 0 0 621.3815/2 SDS 2014-07-08 CL 00652194 CL 2014-07-08 00:00:00 BOOK ddc 0 0 2014-07-08 0 0 621.3815/2 SDS 2014-07-08 CL 00652195 CL 2014-07-08 00:00:00 BOOK ddc 0 0 2014-07-08 0 0 621.3815/2 SDS 2014-07-08 SZM 00652196 SZM 2014-07-08 00:00:00 BOOK ddc 0 0 2014-07-08 0 0 621.3815/2 SDS 2014-07-08 SZM 00652197 SZM 2014-07-08 00:00:00 BOOK ddc 0