Schroder, Dieter K. <br/><br/>
Semiconductor material and device characterization / 
Dieter K. Schroder. 
 - 3rd ed. 
 - [Piscataway, NJ] :  Hoboken, N.J. :  IEEE Press ;  Wiley,  c2006. 
 - xv, 779 p. :  ill. ;  25 cm. 
<br/><br/> "Wiley-Interscience." 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0471739065 (acidfree paper) 9780471739067 
<br/><br/><label>LCCN: </label>2005048514 
<br/><br/><label>Nat. Bib. No.: </label>GBA573304  bnb 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>013282982  Uk 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Semiconductors--Testing.
<br/><br/><label>LC Class. No.: </label>QC611  / .S335 2006 
<br/><br/><label>Dewey Class. No.: </label>621.3815/2  / SDS