TY  - BOOK
AU  - Bushnell,Michael L.
AU  - Agrawal,Vishwani D.
TI  - Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
SN  - 0792379918 (alk. paper)
AV  - TK7874.75 .B87 2000
U1  - 621.39/5 21
PY  - 2000///
CY  - Boston
PB  - Kluwer Academic
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Digital integrated circuits
KW  - Mixed signal circuits
KW  - Semiconductor storage devices
N1  - Includes bibliographical references (p. [631]-670) and index
UR  - http://www.loc.gov/catdir/enhancements/fy0821/00046212-t.html
ER  -