Bushnell, Michael L.  1950- <br/><br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / 
Michael L. Bushnell, Vishwani D. Agrawal. 
 - Boston :  Kluwer Academic,  c2000. 
 - xviii, 690 p. :  ill. ;  26 cm. 
 - Frontiers in electronic testing ;  17 .
<br/><br/>Includes bibliographical references (p. [631]-670) and index. 
<br/><br/><label>ISBN: </label>0792379918 (alk. paper) 
<br/><br/><label>LCCN: </label>00046212  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing.<br/>Digital integrated circuits--Testing.<br/>Mixed signal circuits--Testing.<br/>Semiconductor storage devices--Testing.
<br/><br/><label>LC Class. No.: </label>TK7874.75  / .B87 2000 
<br/><br/><label>Dewey Class. No.: </label>621.39/5  / BME