TY  - BOOK
AU  - Abramovici,Miron
AU  - Breuer,Melvin A.
AU  - Friedman,Arthur D.
TI  - Digital systems testing and testable design
SN  - 0780310624
AV  - TK7874 .A23 1990b
U1  - 621.3815 22
PY  - 1994///], c1990
CY  - New York
PB  - IEEE Press
KW  - Digital integrated circuits
KW  - Testing
KW  - Design and construction
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/bios/wiley045/94233953.html
UR  - http://www.loc.gov/catdir/description/wiley039/94233953.html
UR  - http://www.loc.gov/catdir/toc/onix07/94233953.html
ER  -