01352cam a2200337 a 4500 4446298 OSt 20150408114150.0 941201t19941990nyua b 001 0 eng 94233953 0780310624 DLC DLC DLC TK7874 .A23 1990b 22 621.3815 AMD Abramovici, Miron. 39462 Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. Rev. print. New York : IEEE Press, [1994], c1990. xviii, 652 p. : ill. ; 27 cm. Includes bibliographical references and index. Digital integrated circuits Testing. 39463 Digital integrated circuits Design and construction. 39464 Breuer, Melvin A. 39465 Friedman, Arthur D. 39466 Contributor biographical information http://www.loc.gov/catdir/bios/wiley045/94233953.html Publisher description http://www.loc.gov/catdir/description/wiley039/94233953.html Table of Contents http://www.loc.gov/catdir/toc/onix07/94233953.html 7 cbc orignew 2 ncip 19 y-gencatlg ddc BOOK 31928 266428 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 CL 00651135 CL 2013-11-12 00:00:00 BOOK ddc 0 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 CL 00651136 CL 2013-11-12 00:00:00 BOOK ddc 0 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 CL 00651137 CL 2013-11-12 00:00:00 BOOK ddc 0 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 SZM 00651138 SZM 2013-11-12 00:00:00 BOOK ddc 0 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 SZM 00651139 SZM 2013-11-12 00:00:00 BOOK ddc 0 0 2013-11-12 0 0 621.3815 AMD 2013-11-12 SZM 00651140 SZM 2013-11-12 00:00:00 BOOK ddc 0