Abramovici, Miron. <br/><br/>
Digital systems testing and testable design / 
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. 
 - Rev. print. 
 - New York :  IEEE Press,  [1994], c1990. 
 - xviii, 652 p. :  ill. ;  27 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0780310624 
<br/><br/><label>LCCN: </label>94233953  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing.<br/>Digital integrated circuits--Design and construction.
<br/><br/><label>LC Class. No.: </label>TK7874  / .A23 1990b 
<br/><br/><label>Dewey Class. No.: </label>621.3815  / AMD